AutoPDK is the first AI-powered platform for automated semiconductor device parameter extraction. Built for the next generation of semiconductor research.
Traditional semiconductor modeling tools haven't evolved with modern technology, leaving researchers with outdated workflows.
Legacy tools require extensive scripting knowledge. Engineers spend more time writing code than analyzing devices.
Traditional platforms lack AI capabilities, missing the opportunity to automate complex parameter extraction tasks.
Desktop-only applications with monolithic designs that can't scale or integrate with modern infrastructure.
A comprehensive platform built from the ground up for modern semiconductor research.
Intelligent parameter extraction that understands semiconductor physics and automates complex optimization workflows.
Simply describe what you need in your own language. Scripts are generated and executed for any quality metric or analysis.
Comprehensive visualization tools for parametric analysis, scaling studies, and quality assessment.
User-friendly GUI with optimized data read/write operations for seamless workflow experience.
Modern design allows multiple simulation engines to run in parallel, dramatically increasing throughput and efficiency.
We customize the platform to match your organizational workflow and modeling requirements.
Unlike legacy tools that require extensive scripting, AutoPDK's AI understands semiconductor physics and generates analysis scripts for any quality metric you request.
No scripting skills needed. Just describe what you want in your native language.
AI understands device physics to recommend optimal extraction strategies.
Option to deploy local LLM on your infrastructure for complete data protection.
From request to plot in seconds, not hours of script debugging.
Keep your team's modeling knowledge organized and accessible. Import your extraction guidelines and reference documents to help setup consistent workflows quickly.
Store and access previous generation models as reference knowledge base
Upload your extraction documents and create organization-specific templates
Get instant insights without loading complex stages - just ask and see
Visualize any metric instantly, saving hours of manual setup time
Encode your organization's modeling philosophy into reusable templates
Compare current extraction against historical models instantly
Comprehensive statistical modeling for design reliability and yield optimization.
Statistical simulations with histogram visualization for model reliability assessment
Complete FF, SS, TT, FS, SF corner modeling for worst-case design validation
Identify which parameters have the most impact on device performance
Visualize parameter distributions, histograms, and statistical metrics
Full temperature range modeling from cryogenic to high-temp operations
Comprehensive voltage and current sweep characterization
Core capabilities ready for your device characterization workflows today.
Support for MDIF, CSV, Touchstone, and major probe station formats
Export to Spectre, HSPICE, Eldo, and other simulator netlist formats
Complete DC characterization and capacitance voltage profiling
Visualize spatial variation with interactive wafer heatmaps and statistics
Track model iterations and compare versions across development cycles
Complete characterization across all device dimensions and aspect ratios
Features currently in development to expand AutoPDK's capabilities.
Flicker noise (1/f) and thermal noise parameter extraction
Aging effects including BTI, HCI, and TDDB degradation analysis
Device mismatch characterization with Pelgrom coefficient extraction
Statistical yield analysis based on process variation models
LOD and WPE modeling for advanced node accuracy
High-frequency characterization with fT, fmax, and S-parameter analysis
Group devices by geometry ranges for foundry-compatible model delivery
Continuous development driven by researcher feedback and industry needs
Comprehensive support for industry-standard compact models. Plus, integrate your own customized Verilog-A models for specialized device modeling.
Need a specialized model? Integrate your own Verilog-A models seamlessly into the platform.
A balanced look at what AutoPDK offers compared to established tools in the market.
Join the next generation of semiconductor device modeling. Request early access and be among the first to experience AI-powered parameter extraction.